Structure of oxide glasses by synchrotron X-ray and neutron diffraction

Suzuya, Kentaro

Hamon, 13(1), p.51 - 55, 2003/01

https://doi.org/10.5611/hamon.13.51

With the arrival of the latest generation of synchrotron sources and the introduction of advanced insertion devices, the high-energy (E 30 keV) X-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials. Recently, the high-energy X-ray diffraction data have been combined with neutron diffraction data from a pulsed source to provide more detailed and reliable structural information than that hitherto available. We have developed a two-axis diffractometer for glass, liquid and amorphous materials at the SPring-8 high-energy X-ray diffraction beamline BL04B2. Furthermore, we have succeeded to analyze the intermediate-range order of network forming glasses, SiO, BO, and GeO by the reverse Monte Carlo (RMC) modelling technique with special focused on the ring structures using both high-energy X-ray and neutron diffraction data.

Flux and power spectra of photon sources from bending magnets and insertion devices at a 8 GeV storage ring

Harami, Taikan

JAERI-M 89-079, 35 Pages, 1989/06

JAERI-M-89-079.pdf:0.68MB

no abstracts in English